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Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same

US 5,877,035 A · Assignee: Mitsubishi Denki Kabushiki Kaisha · Inventors: Fujino; Naohiko et al.

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Listed from its USPTO record in Patent Yard's full-term archive. Its claims, description and drawings are in the USPTO PDF and on Google Patents, and the Claude kit works from them.

Why it's free to use

  • Filed February 12, 1996. A US utility patent lasts 20 years from filing, so its term ended February 12, 2016.
  • Patents filed before May 29, 2000 can't get a term adjustment for USPTO delays, and any other extension is capped at five years, so it can't still be in force.
  • We haven't checked its US family, and a later related patent could still be in force. We check US rights only.
FiledFebruary 12, 1996
GrantedMarch 2, 1999
Term endedFebruary 12, 2016
Application number08/600141
Classification (CPC)G01N21/94 +2 more
Length25 pages

Timeline

Timeline From USPTO dates

1997199920012003200520072009201120132015Application filedFeb 12, 1996Patent grantedMarch 2, 1999Term endedFeb 12, 2016

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