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Semi-conductor component test procedure, as well as a data buffer component

US 2005/0254324 A1 · Assignee: Infineon Technologies AG · Inventors: Bucksch, Thorsten

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Listed from its USPTO record in Patent Yard's full-term archive. Its claims, description and drawings are in the USPTO PDF and on Google Patents, and the Claude kit works from them.

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Why it's free to use

  • Published November 17, 2005, and no patent has issued anywhere in its US family since.
  • Nothing has been filed in its family for more than seven years, so it is very unlikely to still be pending.
  • This status is inferred from USPTO records. Confirm it on Patent Center before relying on it.
FiledApril 26, 2005
PublishedNovember 17, 2005
StatusAbandoned (inferred)
Application number11/114226
Classification (CPC)G11C29/26 +2 more
Length11 pages

Timeline

Timeline From USPTO dates

Application filedApril 26, 2005Application publishedNov 17, 2005

Sources & verification

Official USPTO records

Full published documentText and every drawing sheet as a PDF.USPTOFile historyStatus, office actions, notices, fee records and petitions.USPTO Patent CenterPatent Public Search recordSearchable full text and bibliographic data.USPTO

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