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Expired European patentEurope

Integrated circuit and a method for secure testing

EP 1817595 B1 · Applicant: Freescale Semiconductor Inc.

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Listed from its EPO record in Patent Yard's archive of European patents past their term. Its claims, description and drawings are in the EPO PDF and on Google Patents, and the Claude kit works from them.

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Why it's free to use

  • Filed November 22, 2004 and granted March 4, 2009. A European patent lasts at most 20 years from filing, so its term ended November 22, 2024.
  • Supplementary protection certificates extend only medicine and crop-protection patents, and it isn't classified as either.
  • We check European rights only. A US or other national patent in its family could still be in force: check its family on Espacenet or Google Patents.
FiledNovember 22, 2004
PublishedAugust 15, 2007
GrantedMarch 4, 2009
Term endedNovember 22, 2024
Application numberEP 04804390
Classification (CPC)G01R31/31719 +1 more

Timeline

Timeline From EPO dates

2005200720092011201320152017201920212023Application filedNov 22, 2004PublishedAug 15, 2007Patent grantedMarch 4, 2009Term endedNov 22, 2024

Sources & verification

Official EPO records

Full published documentClaims, description and drawings as a PDF.EPOEuropean Patent RegisterProcedure, status, file inspection and legal events.EPOLinked open EP data recordThe bibliographic record this page is built from.EPO

Cross-check elsewhere

Google PatentsFull text, worldwide family, citing patents and legal events.patents.google.comEspacenetNational family members and their legal status.European Patent Office

Everything on this page comes from the EPO record linked above. EPO data used under CC BY 4.0.