European application, no grantEurope
A method of patterning photoresist on a wafer using a reflective mask with a multi-layer arc
EP 1602007 A2 · Applicant: Freescale Semiconductor, Inc.
Overview
The published document from the EPO: abstract, claims, description and drawings. Open it full size
Read the whole patent
Listed from its EPO record in Patent Yard's archive of European patents past their term. Its claims, description and drawings are in the EPO PDF and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed February 13, 2004 and never granted as a European patent. Had it been granted, its 20-year term would have ended February 13, 2024.
- Supplementary protection certificates extend only medicine and crop-protection patents, and it isn't classified as either.
- We check European rights only. A US or other national patent in its family could still be in force: check its family on Espacenet or Google Patents.
FiledFebruary 13, 2004
PublishedDecember 7, 2005
GrantedNever granted
Term endedFebruary 13, 2024
Application numberEP 04711211
Classification (CPC)G03F1/54 +2 more
Timeline
Timeline From EPO dates
Sources & verification
Official EPO records
Everything on this page comes from the EPO record linked above. EPO data used under CC BY 4.0.