Patent Yard Sign in
Expired European patentEurope

Test method of semiconductor device and anisotropic conductive film therefor

EP 1024366 B1 · Applicant: NITTO DENKO CORPORATION

EPO PDF

Overview

The published document from the EPO: abstract, claims, description and drawings. Open it full size

Read the whole patent

Listed from its EPO record in Patent Yard's archive of European patents past their term. Its claims, description and drawings are in the EPO PDF and on Google Patents, and the Claude kit works from them.

Google PatentsEPO PDF

Why it's free to use

  • Filed January 27, 2000 and granted June 11, 2003. A European patent lasts at most 20 years from filing, so its term ended January 27, 2020.
  • A supplementary protection certificate, which can extend a medicine or crop-protection patent, adds at most five and a half years, so even that would have ended by July 27, 2025.
  • We check European rights only. A US or other national patent in its family could still be in force: check its family on Espacenet or Google Patents.
FiledJanuary 27, 2000
PublishedAugust 2, 2000
GrantedJune 11, 2003
Term endedJanuary 27, 2020
Application numberEP 00101568
Classification (CPC)G01R1/0408

Timeline

Timeline From EPO dates

2001200320052007200920112013201520172019Application filedJan 27, 2000PublishedAug 2, 2000Patent grantedJune 11, 2003Term endedJan 27, 2020

Sources & verification

Official EPO records

Full published documentClaims, description and drawings as a PDF.EPOEuropean Patent RegisterProcedure, status, file inspection and legal events.EPOLinked open EP data recordThe bibliographic record this page is built from.EPO

Cross-check elsewhere

Google PatentsFull text, worldwide family, citing patents and legal events.patents.google.comEspacenetNational family members and their legal status.European Patent Office

Everything on this page comes from the EPO record linked above. EPO data used under CC BY 4.0.