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Expired European patentEurope

Method and apparatus for testing semiconductor dice

EP 0826152 B1 · Applicant: MICRON TECHNOLOGY, INC.

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Overview

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Listed from its EPO record in Patent Yard's archive of European patents past their term. Its claims, description and drawings are in the EPO PDF and on Google Patents, and the Claude kit works from them.

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Why it's free to use

  • Filed April 30, 1996 and granted November 15, 2006. A European patent lasts at most 20 years from filing, so its term ended April 30, 2016.
  • A supplementary protection certificate, which can extend a medicine or crop-protection patent, adds at most five and a half years, so even that would have ended by October 30, 2021.
  • We check European rights only. A US or other national patent in its family could still be in force: check its family on Espacenet or Google Patents.
FiledApril 30, 1996
PublishedMarch 4, 1998
GrantedNovember 15, 2006
Term endedApril 30, 2016
Application numberEP 96915407
Classification (CPC)G01R31/2893 +2 more

Timeline

Timeline From EPO dates

1997199920012003200520072009201120132015Application filedApril 30, 1996PublishedMarch 4, 1998Patent grantedNov 15, 2006Term endedApril 30, 2016

Sources & verification

Official EPO records

Full published documentClaims, description and drawings as a PDF.EPOEuropean Patent RegisterProcedure, status, file inspection and legal events.EPOLinked open EP data recordThe bibliographic record this page is built from.EPO

Cross-check elsewhere

Google PatentsFull text, worldwide family, citing patents and legal events.patents.google.comEspacenetNational family members and their legal status.European Patent Office

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