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Expired European patentEurope

Method of analyzing metal impurities in surface oxide film of semiconductor substrate

EP 0488149 B1 · Applicant: SEIKO EPSON CORPORATION

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Listed from its EPO record in Patent Yard's archive of European patents past their term. Its claims, description and drawings are in the EPO PDF and on Google Patents, and the Claude kit works from them.

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Why it's free to use

  • Filed November 26, 1991 and granted May 8, 1996. A European patent lasts at most 20 years from filing, so its term ended November 26, 2011.
  • A supplementary protection certificate, which can extend a medicine or crop-protection patent, adds at most five and a half years, so even that would have ended by May 26, 2017.
  • We check European rights only. A US or other national patent in its family could still be in force: check its family on Espacenet or Google Patents.
FiledNovember 26, 1991
PublishedJune 3, 1992
GrantedMay 8, 1996
Term endedNovember 26, 2011
Application numberEP 91120154
Classification (CPC)G01N33/20

Timeline

Timeline From EPO dates

1992199419961998200020022004200620082010Application filedNov 26, 1991PublishedJune 3, 1992Patent grantedMay 8, 1996Term endedNov 26, 2011

Sources & verification

Official EPO records

Full published documentClaims, description and drawings as a PDF.EPOEuropean Patent RegisterProcedure, status, file inspection and legal events.EPOLinked open EP data recordThe bibliographic record this page is built from.EPO

Cross-check elsewhere

Google PatentsFull text, worldwide family, citing patents and legal events.patents.google.comEspacenetNational family members and their legal status.European Patent Office

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