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Expired European patentEurope

Method of testing semiconductor elements and apparatus for testing the same

EP 0309956 B1 · Applicant: KABUSHIKI KAISHA TOSHIBA

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Listed from its EPO record in Patent Yard's archive of European patents past their term. Its claims, description and drawings are in the EPO PDF and on Google Patents, and the Claude kit works from them.

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Why it's free to use

  • Filed September 26, 1988 and granted August 3, 1994. A European patent lasts at most 20 years from filing, so its term ended September 26, 2008.
  • A supplementary protection certificate, which can extend a medicine or crop-protection patent, adds at most five and a half years, so even that would have ended by March 26, 2014.
  • We check European rights only. A US or other national patent in its family could still be in force: check its family on Espacenet or Google Patents.
FiledSeptember 26, 1988
PublishedApril 5, 1989
GrantedAugust 3, 1994
Term endedSeptember 26, 2008
Application numberEP 88115783
Classification (CPC)G01R31/305

Timeline

Timeline From EPO dates

1989199119931995199719992001200320052007Application filedSep 26, 1988PublishedApril 5, 1989Patent grantedAug 3, 1994Term endedSep 26, 2008

Sources & verification

Official EPO records

Full published documentClaims, description and drawings as a PDF.EPOEuropean Patent RegisterProcedure, status, file inspection and legal events.EPOLinked open EP data recordThe bibliographic record this page is built from.EPO

Cross-check elsewhere

Google PatentsFull text, worldwide family, citing patents and legal events.patents.google.comEspacenetNational family members and their legal status.European Patent Office

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