Defect inspection apparatus and defect inspection method
CA 2647004 C · Owner: Hatanaka, Hiroaki · Inventors: Tagami, Minoru; Hatanaka, Hiroaki; Ido, Nobukazu
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
An object of the present invention is to quantitatively evaluate a distribution of , defects which are generated within an inspection material. In order to achieve this , object, the present invention provides a defect inspection apparatus comprising: an , ultrasonic wave probe; an ultrasonic wave transmitting and receiving device that , irradiates ultrasonic waves via the ultrasonic wave probe onto a surface of an inspection , material on which a predetermined propagation medium has been provided and , that also , receives as noise signals ultrasonic waves that have been scattered by defects present in , the interior of the inspection material; a frequency spectrum calculation …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed March 24, 2006 and granted February 12, 2013. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended March 24, 2026.
- Certificates of supplementary protection extend only drug patents, and it isn't classified as one.
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Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.