Systems and methods for correcting optical reflectance measurements
CA 2605467 C · Owner: Soyemi, Olusola O. · Inventors: Soller, Babs R.; Shear, Michael A.; Soyemi, Olusola O.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target and a second set of data including , information corresponding to features overlying the internal target; and (d) a …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed April 25, 2006 and granted December 24, 2013. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended April 25, 2026.
- Certificates of supplementary protection extend only drug patents, and it isn't classified as one.
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Timeline
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Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.