System and method for focused ion beam data analysis
CA 2587747 C · Owner: Dcg Systems, Inc. · Inventors: Lagarec, Ken Guillaume; Phaneuf, Michael William; Anderson, Michael Anthony
Overview
Its claims, description and drawings are in the Canadian Patents Database.
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A system and method for improving FIB milling endpointing operations. The methods involve generating real-time images of the area being milled and realtime graphical plots of pixel intensities with an increased sensitivity over native FIB system generated images and plots. The images and plots are generated with raw signal data obtained from the native FIB system. More specifically, the raw signal data is processed according to specific algorithms for generating images and corresponding intensity graphs which can be reliably used for accurate endpointing. In particular the displayed images , will display more visual information regarding changes in milled material while the intensity …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed November 15, 2005 and granted January 8, 2013. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended November 15, 2025.
- Certificates of supplementary protection extend only drug patents, and it isn't classified as one.
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Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.