Inspection method and system using multifrequency phase analysis
CA 2537531 C · Owner: General Electric Company · Inventors: Wang, Changting; Suh, Ui Won; Ertekin, Serkan
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A method for inspecting a part is provided. The method includes applying a number of multifrequency excitation signals to a probe (12) to generate a number of multifrequency response signals for the part (18) being inspected. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect a subsurface of the part (18). An inspection system (10) is provided and includes an eddy current (EC) probe (12) configured to induce eddy currents in a part (18). The system (10) further includes an eddy current instrument (14) coupled to the EC probe (12) and configured to apply multifrequency excitation signals to the EC probe (12) to generate …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed February 23, 2006 and granted April 12, 2016. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended February 23, 2026.
- Certificates of supplementary protection extend only drug patents, and it isn't classified as one.
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Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.