Identifying critical features in ordered scale space
CA 2509580 C · Owner: Knight, William · Inventors: Knight, William
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A system and method for identifying critical features in an ordered scale space within a , multi-dimensional feature space is described. Features are extracted from a plurality of data , collections. Each data collection is characterized by a collection of features semantically-related , by a grammar. Each feature is normalized and frequencies of occurrence and cooccurrences for , the feature for each of the data collections is determined. The occurrence frequencies and the co-occurrence , frequencies for each of the features are mapped into a set of patterns of occurrence , frequencies and a set of patterns of co-occurrence frequencies. The pattern for each data , collection is …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed December 11, 2003 and granted December 9, 2014. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended December 11, 2023.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by December 11, 2025.
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Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.