Method and system for characterizing streak defects in web structures
CA 2460068 A1 · Owner: The Research Foundation Of State University Of New York · Inventors: Keller, D. Steven; Kellomaki, Markku
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Streak defects in web structures are characterized by electronically obtaining a plurality of results of a plurality of tests of a web structure electronically determining a location of and/or a quantification of one or more streak defects based on the plurality of results and electronically , characterizing the streak defect(s) as being static or stochastic based on the plurality of results.
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed September 16, 2002. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended September 16, 2022.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by September 16, 2024.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.