A time-of-flight mass spectrometer for monitoring of fast processes

Abstract From the Canadian patent

Time-of-flight mass spectrometer instruments for monitoring fast processes using an interleaved timing scheme and a position sensitive detector (42,43) are described. One embodiment of the present invention consists of an apparatus comprising an ion source (1) and repetitively generating ions (4) an ion extractor (31) fluidly coupled to the ion source (1) and extracting ions from it for time-of-flight measurement in a time-of-flight mass section (3). A position sensitive ion detector (42,43) is fluidly coupled to the timeof-flight mass section (3) to detect the ions. The apparatus also has a timing controller (60) in electronic communication with the ion source (1) and the ion …