Method for testing circuits with tri-state drivers and circuit for use therewith
CA 2393940 A1 · Owner: Logicvision, Inc. · Inventors: Nadeau-Dostie, Benoit
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A scan-testing method a circuit having tri-state bus drivers involves disabling all drivers during scan intervals and enabling at most a selected one of the drivers during the capture interval by generating a driver select signal for each driver and gating each driver select signal with the circuit functional enable signal for each driver to generate a driver enable signal the driver select signals being generated in such a manner that at most only a selected one of the drivers is active during the capture interval. The selected one of the drivers is selected by loading a driver select code into memory elements during the scan-in sequence and decoding the driver select code to …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed December 18, 2000. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended December 18, 2020.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by December 18, 2022.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
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Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.