Multi-layered electronic parts
CA 2373116 A1 · Owner: Beltronics Inc. · Inventors: Bishop, Robert
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A novel optical inspection technique for multi-layer wafers and the like in which conductor patterns of a top layer only are to be inspected such layer , being upon an intermediate transparent or translucent insulation layer in turn upon a base layer(s) thereunder, wherein the intermediate layer only is fluoresced, displaying the top layer conductors as dark in the field of fluorescent light, and causing reflections from layers below the intermediate layer effectively to disappear to obviate confusion with the top layer conductors to be inspected.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed November 15, 1999. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended November 15, 2019.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by November 15, 2021.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.