Method of and apparatus for measuring lattice-constant, and computer program
CA 2366718 A1 · Owner: Matsuda, Takeyoshi · Inventors: Seo, Satoru; Mitose, Kengo; Matsuda, Takeyoshi
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A condenser angle of 0.5 mrad or below is set with respect to a specimen. Electron-beam diameter of 20 to 100 nm .PHI. is set onto the surface of the specimen. A flux of highly parallel electron beams is irradiated onto the specimen having a strained layer quantum well structure. An image of electrons diffracted from the specimen is recorded onto an imaging plate. The recorded image is analyzed. Lattice constants and strains of layers of the strained layer quantum well structure are measured based on a result of this analysis.
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed January 8, 2002. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended January 8, 2022.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by January 8, 2024.
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Timeline
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Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.