Method and apparatus for depth profile analysis by laser induced plasma spectroscopy
CA 2353014 A1 · Owner: National Research Council Of Canada · Inventors: Detalle, Vincent; Sabsabi, Mohammad
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Its claims, description and drawings are in the Canadian Patents Database.
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In a method of spectrochemical depth-profile analysis of heterogeneous materials, a first, burst of ablation laser pulses in a first beam is directed at a sample to form an ablation, crater. A second single pulse or burst of laser pulses in a second beam having a smaller, width than said first beam is then directed at the bottom of the crater so as to create a, plasma that emits radiation representative of a component in the sample without a, significant contribution from the walls of the ablation crater. The intensity of radiation, from the plasma is measured and the concentration of the selected component is determined from the intensity of the radiation. The depth at which the …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
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- Filed July 12, 2001. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended July 12, 2021.
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