Mitigating single event upset phenomenon in semiconductor circuits
CA 2348200 A1 · Owner: Renna, Todd Gregory · Inventors: Bogorad, Alexander; Renna, Todd Gregory; Herschitz, Roman
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A circuit and method to mitigate the effects of single event upset phenomenon. The, circuit includes a logic gate connected to provide a fault output only when inputs to the logic, gate are all in the fault state. The method includes comparing the outputs of circuits susceptible, to single event upset phenomenon and providing a fault output only when all circuits are in a, fault condition.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed May 18, 2001. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended May 18, 2021.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by May 18, 2023.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.