Electrostatic adhesion tester for thin film conductors
CA 2284831 A1 · Owner: Yang, Haining S. · Inventors: Griffin, Alfred J. Jr.; Brotzen, Franz R.; Yang, Haining S.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
An electrostatic adhesion tester for thin film conductors. In one embodiment a device is provided for testing the adhesion strength of a thin film conductor that has been formed upon a substrate. The device includes an adhesion tester that is primarily comprised of a conducting portion. The conducting portion is applied to the thin film conductor so that it does not physically contact the thin film conductor but leaves a small space , therebetween. A power supply may further be provided for coupling to either the adhesion tester, the thin film conductor or both in order to create a , potential difference between the conducting portion and the thin film conductor. The potential …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed March 31, 1998. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended March 31, 2018.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by March 31, 2020.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.