Method and apparatus for high-speed interconnect testing

Abstract From the Canadian patent

A method of testing high speed interconnectivity of circuit boards having components operable at a high speed system clock employing an IEEE 1149.1, standard test method in which test data is shifted into and from the components at the rate of a test clock during Shift_In and Shift_Out operations and having an Update, operation and a Capture operation between the Shift_In and Shift_Out operations the, components including a first group of components capable of performing the Update and Capture operations at the rate of the Test Clock only and a second group of components capable of performing the Update and Capture operations at the rate of the system clock, the method comprising the steps …