Probe for fault actuation devices
CA 2248315 A1 · Owner: Belforte, Piero · Inventors: Maggioni, Flavio; Belforte, Piero
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
The probe (10) comprises a transistor (12) of which in use, the collector and , the emitter are connected to the fault insertion point (Pi) and to a reference signal level (M; ~Vcc), respectively. The fault insertion is carried out by bringing the transistor to saturation condition. The effects of the parasitic capacitive coupling between the collector and the base of the transistor (12) are eliminated by placing, between the base and the emitter a capacitor (19) , whose capacitance is substantially higher than said parasitic capacitance. Means (20) for monitoring the current absorbed in correspondence with the fault insertion point are also provided.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed March 5, 1997. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended March 5, 2017.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by March 5, 2019.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.