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An optical device for roughness measurement

CA 2246115 A1 · Owner: Kourilovitch, Andrei · Inventors: Mewdeleev, Vladimir Ya; Sergey, Scovorod'Ko N.; Kourilovitch, Andrei

CIPO record

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Abstract From the Canadian patent

These present inventions represent optical devices for remote measurement of one-dimension roughness. These devices allow the measurement of the roughness automatically with the use of a computer. The first method for the measurement: The interference one-dimension pattern is formed on the rough surface. The direction of a roughness coincides with the direction of the interference pattern. If the, bandwidth in the interference pattern is equal to the period of the roughness then the, light reflected from a rough surface has maximum or minimum intensity. By changing, bandwidth in interference pattern and synchronously measuring intensity of the light, reflected from a rough surface, it is …

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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.

Why it's free to use

  • Filed September 15, 1998. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended September 15, 2018.
  • A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by September 15, 2020.
  • We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
FiledSeptember 15, 1998
GrantedNo grant recorded
Term endedSeptember 15, 2018
Patent numberCA 2246115 A1
Classification (IPC)G01B11/30

Timeline

Timeline From CIPO dates

1999200120032005200720092011201320152017Application filedSep 15, 1998Term endedSep 15, 2018

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Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.