Eddy current flaw detector
CA 2240045 C · Owner: Kawanami, Seiichi · Inventors: Kawanami, Seiichi; Kurokawa, Masaaki; Kamimura, Takeo
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
This invention prevents the failure of detection for horizontal and oblique lift-offs in a probe for an eddy current flaw detection test. Two detection coils (2, 2a, 2b) having mutually different diameters are concentrically disposed on the surface of a testpiece (1). These two detection coils (2) are differentially connected to a bridge circuit (3) for picking up a flaw signal. The two detection coils (2) are adjusted so that interlinkage magnetic fluxes generated inside the detection coils (2) by the eddy current become equal. An excitation coil (4) for inducing the eddy current in the testpiece (1) by AC driving is disposed over detection coils (2). The center of the excitation …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed March 21, 1997 and granted October 22, 2002. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended March 21, 2017.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by March 21, 2019.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.