Apparatus and method for detecting surface defects
CA 2237640 C · Owner: Centre De Recherche Industrielle Du Quebec · Inventors: Gauthier, Pierre
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Apparatus and method for detecting surface defects on an article freely standing on a conveyer, which generate profile trace data corresponding to profile trace at a cross section of the article. A surface shape inspection unit comprising an optical ranging system using laser and camera is provided for obtaining the profile trace data through triangulation-based derivation techniques. Base reference curves are derived from regular portions of the profile trace data. Profile trace data are compared to defect threshold curves to recognize a defect induced departure of the trace data with respect to the base reference curve and to produce a defect output signal. The apparatus and …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed August 8, 1997 and granted July 11, 2000. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended August 8, 2017.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by August 8, 2019.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
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Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.