Semiconductor substrate and method of manufacturing the same
CA 2233115 C · Owner: Canon Kabushiki Kaisha · Inventors: Sato, Nobuhiko; Yonehara, Takao; Sakaguchi, Kiyofumi
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
To provide a manufacturing method excellent in controllability, productivity and economics of a high-quality SOI wafer, and a wafer manufactured by that method, in the wafer manufactured by bonding after, bonding, separation is made on an interface of a high porosity layer in a porous region including a low porosity layer and the high porosity layer in a surface formed on a main surface side of a first Si substrate 2 to transfer a non-porous layer onto a second substrate. After separation at the high porosity layer a residual, low porosity thin layer is made non-porous by a smoothing process such as hydrogen annealing without using selective etching.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed March 25, 1998 and granted March 12, 2002. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended March 25, 2018.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by March 25, 2020.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.