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Automatic defect detection process for mechanical parts with complex geometry

CA 2207833 A1 · Owner: Societe Nationale D'Etude Et De Construction De Moteurs D'Aviation "Snecc.M.A. · Inventors: Prejean-Lefevre, Veronique Helene Marie Pierre; Jochems, Tilman

CIPO record

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Its claims, description and drawings are in the Canadian Patents Database.

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Abstract From the Canadian patent

The automatic defect detection process on a fluoroscope image of a complex part consists in segmenting the fluoroscope image into two classes of area so as to obtain a binary image called a mask, in which the zones that can be assessed and those that cannot are given the values 1 and 0 respectively, then applying to the fluoroscope image conditional morphological transformations developed from a conditional structuring element. The conditional structuring element is obtained by intersection between a traditional structuring element and the mask. Application in particular to the assessment of cast vanes by fluoroscopy.

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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.

Why it's free to use

  • Filed August 4, 1997. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended August 4, 2017.
  • A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by August 4, 2019.
  • We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
FiledAugust 4, 1997
GrantedNo grant recorded
Term endedAugust 4, 2017
Patent numberCA 2207833 A1
Classification (IPC)G01N23/04

Timeline

Timeline From CIPO dates

1998200020022004200620082010201220142016Application filedAug 4, 1997Term endedAug 4, 2017

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Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.