Semiconductor differential pressure measuring device
CA 2173786 C · Owner: Fukuhara, Satoshi · Inventors: Yoshida, Takashi; Fukuhara, Satoshi; Ikeda, Kyoichi
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
This is a semiconductor differential pressure measuring device comprising two measurement diaphragms and two detection sensors provided in a semiconductor substrate using micromachining techniques and a computing circuit which computes the differences between these two sensor outputs: for each of the two measurement diaphragms the measuring pressure transmission communicating hole being provided respectively so that these two measurement diaphragms operate in opposite phases by the differential pressure; and the above two sensors being provided on each relevant measurement diaphragm and detecting the displacement or strain of each measurement diaphragm generated by the differential pressure …
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed April 10, 1996 and granted September 5, 2000. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended April 10, 2016.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by April 10, 2018.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.