Method and apparatus for testing electronic memories for the presence of multiple cell coupling faults

Abstract From the Canadian patent

A method of testing a random access memory (RAM) for single V-coupling faults by establishing a first current value for each cell, for each cell and for each of m data backgrounds, generating a data bit corresponding to an element of an (n, V - 1)exhaustive matrix, and for each of m data backgrounds: (1) applying a read write sequence to each cell; and (2) for each background except the mth background updating the current value of all cells according to the data bits corresponding to that cell; reading each cell of the RAM; and discarding or repairing the RAM if a cell coupling fault is apparent from the series of values read from the cells of the RAM. Data bits are generated by a matrix …