Non-contact photothermal method for measuring thermal diffusivity and electronic defect properties of solids
CA 2126481 C · Owner: Mandelis, Andreas · Inventors: Wolff, Detlev; Munidasa, Mahendra; Mandelis, Andreas
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There is provided a method of measuring thermal diffusivity of solids and electronic lifetimes and defect properties of semiconductors useful for in-situ non-, destructive monitoring of engineered materials and electronic substrates. The method termed photothermal rate window method involves irradiating a sample with a repetitive square laser pulse of duration Tp and period T0 and monitoring the temperature profile by measuring the photothermal signal emitted from the sample. The period T0 of the repetitive heating pulse is maintained constant and the pulse duration Tp is varied in the range between 0 and T0 with the temperature measured at each value of Tp. The method of measuring …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
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- Filed June 22, 1994 and granted March 27, 2001. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended June 22, 2014.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by June 22, 2016.
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Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.