Electron detector device for spectroscopic analyses of surfaces under x-ray excitation
CA 2118921 A1 · Owner: Goulon, Jose · Inventors: Cortes, Robert; Leclerc, Louis; Lampert, Marie O.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
This invention concerns an electron detector device for spectroscopic analyses of surfaces under monochromatic X-ray excitation this detector comprising: (i) a silicon diode (9) which is able to detect with a gain ã 1 accelerated secondary electrons; (ii) a microchannel plate (5) to pre-amplify the conversion photoelectrons emitted by the sample (1) and which is used at extremely low, gain but with excellent linearity characteristics. The key component is a cooled Si-diode made of high resistivity n-type silicon with an ion implanted p+ layer (11) which is about 1300 Å thick. Its performances in detecting energetic electrons result from the absence of additional dead layers (passivated SiO2 …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed September 17, 1991. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended September 17, 2011.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by September 17, 2013.
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Timeline
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Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.