Burn-in apparatus and method
CA 2073896 A1 · Owner: Sumitomo Electric Industries, Ltd. · Inventors: Nishiguchi, Masanori; Hashinaga, Tatsuya
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
In placing semiconductor devices as devices-to-betested with semiconductor chips incorporated therein in an environment of a set temperature and testing the devices by feeding the semiconductor chips temperature, sensors, such as diodes, are formed beforehand on the semiconductor chips, and during a test electric, characteristics of the temperature sensors (e.g. forward threshold voltages of the diodes) are detected so as to measure temperatures of the semiconductor chips, and based on measured results of the temperatures, environmental temperatures in test container and/or applying voltages to the semiconductor chips are controlled.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed July 15, 1992. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended July 15, 2012.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by July 15, 2014.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.