Burn-in apparatus and method
CA 2073886 A1 · Owner: Sumitmo Electric Industries, Ltd. · Inventors: Hashinaga, Tatsuya; Nishiguchi, Masanori
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A burn-in apparatus used in burn-in tests includes a burn-in test chamber for accommodating a plurality of semiconductor devices to be tested. Also the burn-in, apparatus includes measuring means for detecting electric characteristics of temperature sensors built in the respective semiconductor devices to individually measure junction temperatures of the semiconductor chips incorporated in the respective semiconductor devices, and laser beam irradiating means or electric heating members. The laser irradiating means or the heating members are controlled by control means based, on outputs of the measuring means. Thus the junction, temperatures are maintained in a set junction temperature …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed July 15, 1992. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended July 15, 2012.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by July 15, 2014.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.