Method of operating an ion trap mass spectrometer in a high resolution mode
CA 2066893 C · Owner: Syka, John Edward Philip · Inventors: Syka, John Edward Philip; Schwartz, Jae Curtis; Louris, John Nathan
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A method of analyzing a sample trapped within a three-dimensional ion trap which, includes combined quadrupole and supplementary A.C. fields in which the combined, fields are scanned to resonantly eject ions of consecutive mass-to-charge ratio from the, trap at a rate so that the length of time corresponding to 200 cycles or more of the, supplementary field occurs per consecutive thomson.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed April 23, 1992 and granted November 19, 2002. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended April 23, 2012.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by April 23, 2014.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.