Method and apparatus for the cross-sectional measurement of electric insulated conductors
CA 2065075 C · Owner: Jung, Ulrich · Inventors: Jung, Ulrich; Kotter, Wilfried; Salzmann, Hannes
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A method and an apparatus for an exact measurement of the thickness of a plurality of individual semi-conductor and insulation layers and the determination of the centricity/eccentricity of a medium-voltage and/or high-voltage insulated conductor. The individual semi-conductor and insulation layers of the insulated conductor emerging from an extrusion device are penetrated with X-rays in at least two directions laying within a plane orthogonal to the axis of the insulated conductor. On carrying out inline scanning intensity detection of the X-rays having penetrated the insulated conductor, the thickness of the individual layers as well as the position of the conductor is computed. These …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed April 3, 1992 and granted January 29, 2002. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended April 3, 2012.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by April 3, 2014.
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Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.