Examination of physical properties of thin films
CA 2035686 A1 · Owner: Knobloch, Harald · Inventors: Knobloch, Harald; Knoll, Wolfgang; Knobloch, Harald
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
8 - O.Z. 0050/41393, Abstract of the Disclosure: The physical properties of thin films can be examined with polarized light using a method which comprises directing polarized light at a layer system, exciting plasmon surface polaritons therein and thereby creating Raman-scattered light within the layer or layer system under examination and imaging said, light on a detector using an imaging system.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed February 5, 1991. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended February 5, 2011.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by February 5, 2013.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.