Apparatus and method for documenting faults in computing modules
CA 2022229 A1 · Owner: Bruckert, William · Inventors: Bissett, Thomas D.; Nene, Ravi; Bruckert, William
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Method and apparatus for testing the operation of modules for use in a fault tolerant computing system that consists of two distinct computing zones. Diagnostic testing is performed when the system is powered on, the modules being subjected to module, zone and, if both zones are available system diagnostic, tests. Indications of faults detected during diagnostic testing are stored in an EEPROM on each module. Such fault indications can be cleared in the field by correcting the fault condition and successfully rerunning the diagnostic test during which the fault was detected. Indications of operating system detected faults are also stored in each module EEPROM. However such, fault …
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed July 30, 1990. No grant is recorded for it in Canada; had it been granted, its 20-year term would have ended July 30, 2010.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by July 30, 2012.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.