Method and apparatus for testing circuit boards
CA 2013248 C · Owner: Yau, Chi W. · Inventors: Jarwala, Najmi T.; Yau, Chi W.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A test system is associated with a chain of circuits on a circuit board for testing the interconnections linking the circuits in the chain as well as for testing the interconnections linking them to those on other boards. The test system includes a controller for generating a test signal and for capturing a response signal generated by the associated chain of circuits in response to the test signal. The controller also generates a flow control signal which controls a network that routes the test signals from the controller, or from a first other test system to the, associated chain of circuits. In accordance with the flow control signal, the network also serves to route the response signal …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Filed March 28, 1990 and granted October 18, 1994. A Canadian patent filed from October 1, 1989 lasts 20 years from filing, so its term ended March 28, 2010.
- A certificate of supplementary protection adds at most two years for a drug, so even that would have ended by March 28, 2012.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.