Infrared radiation probe for measuring the temperature of low-emissivity materials in a production line
CA 1319832 C · Owner: National Research Council Of Canada · Inventors: Belanger, Christian; Cielo, Paolo; Krapez, Jean-Claude
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
The invention is concerned with an infrared radiation probe for measuring the temperature at the surface of an object by measurement of the infrared radiation emitted from the surface. The infrared radiation probe according to the invention has a head positionable in spaced relation to the object surface and comprising at least one angularly inclined reflective surface having a predetermined surface area and disposed at an angle relative to the object surface such as to define with the object surface a wedge-shaped reflective cavity for increasing effective emissivity of the object surface by multiple reflections, and a bundle of optical fibers having a predetermined angular aperture at a …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted July 6, 1993. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended July 6, 2010.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.