Probe for testing printed circuit boards
CA 1317385 C · Owner: Teradyne, Inc. · Inventors: Diperna, Paul Mario
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Apparatus for testing the electrical integrity of printed circuit boards under test (BUTs) each BUT, having a plurality of downwardly directed accessible nodes, the apparatus including support means for removably supporting the BUT, test circuitry including a plurality of upwardly directed channel nodes below the support means, connection means for electrically connecting the channel nodes to the BUT nodes the, connection means comprising a universal board carrying probes in a universal grid pattern, means to activate selective probes, and a translator board to make electrical connection between upper and lower conductors in different patterns.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted May 4, 1993. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended May 4, 2010.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.