Method for monitoring deformations of components with light waveguides
CA 1311939 C · Owner: Miesseler, Hans-Joachim · Inventors: Miesseler, Hans-Joachim; Wolff, Reinhard; Weiser, Martin
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A b s t r a c t, Method for the monitoring of deformations of components by means of light waveguides, in which method the light waveguides are mechanically prestressed to such an extent relatively to the component or in themselves that at all levels of deformation expected to occur in the component their stressing remains in the tension range. This obviates upsetting of the light-conducting fibre of the light waveguide, such upsetting phenomena resulting in undesirable damping of the light pulses sent through the light waveguide and falsifying the measurement result in the course of stress monitoring operations.
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted December 29, 1992. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended December 29, 2009.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.