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Expired Canadian patentCanada

Fault detection circuit capable of detecting burst errors in an lru memory

CA 1302575 C · Owner: Nec Corporation · Inventors: Yamada, Ikuo

CIPO record

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Abstract From the Canadian patent

NE-141, "Fault Detection Circuit Capable of Detecting Burst Errors in an LRU Memory" ABSTRACT OF THE DISCLOSURE, A fault detection circuit comprises an LRU memory having a series of bit storage cells for storing data bits therein the, stored bits indicating relationships between most recently referenced timings for each of address levels. Updating input data bits are generated by an LRU update logic in response to the LRU memory being accessed from an external source and applying the generated updating input data bits to the LRU memory to cause same to generate updated output data bits. One of the updating input data bits is inverted prior to application to the LRU memory. An error …

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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.

Why it's free to use

  • Granted June 2, 1992. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended June 2, 2009.
  • We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
FiledApril 14, 1988
GrantedJune 2, 1992
Term endedJune 2, 2009
Patent numberCA 1302575 C
Classification (IPC)G06F11/10 +1 more

Timeline

Timeline From CIPO dates

1989199219951998200120042007Application filedApril 14, 1988Patent grantedJune 2, 1992Term endedJune 2, 2009

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Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.