Method of calibrating reflectance measuring devices
CA 1297700 C · Owner: Miles Laboratories, Inc. · Inventors: Cooper, David M.; Hernicz, Ralph S.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Abstract Of The Disclosure, A method of calibrating reflectance measuring devices, such as spectrophotometers that incorporate automatic gain or sensitivity setting capability. According to the method offset reflectance and reflectance of a secondary reflectance standard for several wavelengths are calculated and stored in a memory of a reflectance measuring device. A secondary standard is mounted in the reflectance measuring device and reflectances at a selected wavelengths from the secondary standard are read prior to measurement of the reflectance of the test sample. The stored offset reflectance and secondary reflectance for the operational wavelength are used to calculate true …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted March 24, 1992. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended March 24, 2009.
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Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.