Optical measuring device
CA 1295829 C · Owner: Mitsubishi Denki Kabushiki Kaisha · Inventors: Nagao, Toshishige
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
An optical measuring device for measuring a thickness of a workpiece or a height of a step thereof comprises a pair of deviation measuring means disposed in opposing relation to the workpiece, a pulse generating circuit for producing alternative pulse signals to control the deviation measuring means and signal processing means for adding outputs of the deviation measuring means each including an optical position detecting element having a light receivig plane disposed on an optical axis having a predetermined angle with respect to an optical axis of light beam irradiating the workpiece, a laser light source for emitting the light beam, a drive circuit responsive to the pulse signal to …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted February 18, 1992. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended February 18, 2009.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.