Circuit condition monitoring system having integral test point
CA 1295367 C · Owner: Schweitzer, Edmund O. Jr. · Inventors: Schweitzer, Edmund O. Jr.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Edmund 0. Schweitzer, Jr. Abstract of the Disclosure A circuit condition monitoring system for an electrical power distribution system includes a connector component having an integrally formed test point which provides fault current or voltage loss monitoring of a conductor within the connector. The connector includes an electrically conductive outer sheath layer. An annular channel formed on the surface of and extending through this layer receives the cylindrical end of a circuit monitoring module to form an electrically-isolated sheath portion which is capacitively coupled to the system conductor and to the module to function as a test point for providing operating power to the module. …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted February 4, 1992. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended February 4, 2009.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.