Film thickness measuring device
CA 1292803 C · Owner: Mitsubishi Denki Kabushiki Kaisha · Inventors: Nagao, Toshishige; Ariki, Masayuki; Ida, Yoshiaki
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A film thickness measuring device for measuring the thickness of a film formed on a sheet member conveyed with the rotation of a rotary shaft. The thickness measurement is accomplished based on averaged values for a period of time which is determined according to the rotation speed of the rotary shaft. Consequently errors, due to the eccentricity or uneven surface of the rotary shaft are removed from the measurement values resulting in improving an accuracy of the thickness measurement of the film.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted December 3, 1991. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended December 3, 2008.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.