Apparatus and methods for measuring permittivity in materials
CA 1288477 C · Owner: Zaretsky, Mark C. · Inventors: Zaretsky, Mark C.; Melcher, James R.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Devices and analytical techniques are disclosed for measuring the spatial profile of permittivity of a material by multiple wavenumber interrogations. Electrode structures are disclosed which define a number of different fundamental wavelengths (or wavenumbers). Spatially periodic interrogation signals (of temporary frequency ".omega.") from the electrode structures are attenuated to varying degrees by the material undergoing analysis depending upon the wavenumber ("k"), thereby permitting the derivation of a composite dielectric profile.
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted September 3, 1991. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended September 3, 2008.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.