Test system for random access memory

Abstract From the Canadian patent

A test system for a random access memory includes: a clock pulse width varying unit for varying a pulse width of driving pulses for a random access memory; a first latch connected to an address input circuit of the random access memory for receiving the output clock signal fo the clock pulse width varying unit and latching an address input signal at the leading edge of the output clock signal; and, a second latch connected to a data output circuit of the random access memory for latching a data output signal. Both the first and second latches are supplied with the same clock signals from the clock pulse width changing unit and a, comparison unit is connected to a data output circuit of the …