Probe for testing electronic components
CA 1284181 C · Owner: Teradyne, Inc. · Inventors: Kern, Walter Phelps
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A probe for electrically contacting a lead of an electronic component providing accurate spacing between tip portions by using an insulator guide having holes through it and positioning wires in the holes so that tip portions of the wires extend from a probe surface.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted May 14, 1991. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended May 14, 2008.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.